Validation of the Reference Impedance in Multiline Calibration With Stepped Impedance Standards-Reference-Cited by-同舟云学术

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Validation of the Reference Impedance in Multiline Calibration With Stepped Impedance Standards

Published:2023 Issue: Volume:2 Page:1-12
ISSN:2768-7236
Container-title:IEEE Open Journal of Instrumentation and Measurement
language:
Short-container-title:IEEE Open J. Instrum. Meas.

Author:

Hatab Ziad¹^ORCID,Gadringer Michael Ernst¹^ORCID,Alterkawi Ahmad Bader Alothman²^ORCID,Bösch Wolfgang¹^ORCID

Affiliation:

1. Christian Doppler Laboratory for Technology Guided Electronic Component Design and Characterization, Institute of Microwave and Photonic Engineering, Graz University of Technology, Graz, Austria

2. Advanced Interconnect Solution Services (AISS), AT&S Austria Technologie & Systemtechnik AG, Leoben, Austria

Funder

Christian Doppler Research Association

Austrian Federal Ministry for Digital and Economic Affairs and the National Foundation for Research, Technology, and Development

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/9552935/10025401/10251578.pdf?arnumber=10251578

Reference42 articles.

1. Characterization and Production of PCB Structures With Increased Ratio of Electromagnetic Field in Air

2. Influence of the PCB Manufacturing Process on the Measurement Error of Planar Relative Permittivity Sensors Up To 100 GHz

3. Comparison of On-Wafer Calibrations

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