Author:
Michalak S.E.,Harris K.W.,Hengartner N.W.,Takala B.E.,Wender S.A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
73 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Compiler-Supported Selective Software Fault Tolerance;2023 IEEE Conference on Dependable and Secure Computing (DSC);2023-11-07
2. Understanding Silent Data Corruptions in a Large Production CPU Population;Proceedings of the 29th Symposium on Operating Systems Principles;2023-10-23
3. Reliability-Aware Runahead;2022 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2022-04
4. Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies;IEEE Transactions on Nuclear Science;2021-05
5. ParaDox: Eliminating Voltage Margins via Heterogeneous Fault Tolerance;2021 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2021-02