AI-Driven Test and Measurement Automation in Electronics Manufacturing-Reference-Cited by-同舟云学术

AI-Driven Test and Measurement Automation in Electronics Manufacturing

Published:2024-04-04 Issue: Volume:54 Page:1-6
ISSN:
Container-title:2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)
language:
Short-container-title:

Author:

Agrawal Anurag Vijay¹,Raju Kommisetti Murthy²,P Aparna³,Sravya Gade⁴,Chandrashekhar A⁵,Ramya J.⁶

Affiliation:

1. J. P. Institute of Engineering and Technology,Department of Electronics and Communication Engineering,Meerut,Uttar Pradesh,India,250001

2. Shri Vishnu Engineering College For Women,Department of Electronics and Communication Engineering,Bhimavaram,Andha Pradesh,India,534202

3. RMK College of Engineering and Technology,Department of Computer Science Engineering,Puduvoyal,Tamil Nadu,India,601206

4. Shri Vishnu Engineering College for Women,Department of Electronics and Communication Engineering,Bhimavaram,Andhra Pradesh,India,534202

5. Faculty of Science and Technology, ICFAI, Foundation for Higher Education,Department of Mechanical Engineering,Hyderabad,Telangana,India,501203

6. St. Joseph's College of Engineering,OMR,Department of Artificial Intelligence and Data Science,Chennai,Tamil Nadu,India,600119

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10568576/10568577/10568717.pdf?arnumber=10568717

Reference13 articles.

1. Maximum Power Point Tracking of PV Grids Using Deep Learning

2. Study of the performance signature based ternary and quaternary III- V compounds for laser diodes in optical communication system;Govindaraj;Journal of Optical Communications,2023

3. Configuration analysis of SnS based solar cells for high-efficiency devices;Kumar;Opt Quant Electron,2022

4. Measuring Manufacturing Test Data Analysis Quality