Spatially resolved silicon solar cell characterization using infrared imaging methods-Reference-Cited by-同舟云学术

Spatially resolved silicon solar cell characterization using infrared imaging methods

Published:2008-05 Issue: Volume: Page:
ISSN:
Container-title:2008 33rd IEEE Photovoltaic Specialists Conference
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Author:

Kasemann M.¹,Kwapil W.¹,Schubert M.C.¹,Habenicht H.¹,Walter B.¹,The M.¹,Kontermann S.¹,Rein S.¹,Breitenstein O.²,Bauer J.²,Lotnyk A.²,Michl B.³,Nagel H.³,Schutt A.⁴,Carstensen J.⁴,Foll H.⁴,Trupke T.⁵,Augarten Y.⁵,Kampwerth H.⁵,Bardos R.A.⁶,Pingel S.⁷,Berghold J.⁷,Warta W.¹,Glunz S.W.¹

Affiliation:

1. Fraunhofer Institute for Solar Energy Systems (ISE), Heidenhofstr. 2, 79110 Freiburg, Germany

2. Max Planck Institute for Microstructure Physics, Weinberg 2, 06120 Halle, Germany

3. SCHOTT Solar GmbH, Carl-Zeiss-Straße 4, 63755 Alzenau, Germany

4. University of Kiel, Kaiserstr. 2, 24143, Germany

5. The University of New South Wales, Sydney, 2052, Australia

6. BT Imaging Pty Ltd, 18 Bulletin Place, Sydney, 2000, NSW, Australia

7. Solon AG, Am Studio 16, 12489 Berlin, Germany

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4815197/4922425/04922478.pdf?arnumber=4922478

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