Formation and annihilation of the metastable defect in boron-doped Czochralski silicon-Reference-Cited by-同舟云学术

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Formation and annihilation of the metastable defect in boron-doped Czochralski silicon

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Container-title:Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.
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Author:

Schmidt J.,Bothe K.,Hezel R.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/8468/26685/01190485.pdf?arnumber=1190485

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