On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies

Published:2009 Issue: Volume: Page:
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Wu Ernest Y.,Suñé Jordi

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/5075842/05072256.pdf?arnumber=5072256

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

2. Application of artificial neural networks to the identification of weak electrical regions in large area MIM structures;Microelectronics Reliability;2021-11

3. Failure Analysis of Large Area Pt/HfO2/Pt Capacitors Using Multilayer Perceptrons;2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2021-09-15

4. Design for Stress;2021 Annual Reliability and Maintainability Symposium (RAMS);2021-05-24

5. Universal Impacts of Local Electric Fields on the Projected Dielectric Lifetime;2021 IEEE International Reliability Physics Symposium (IRPS);2021-03

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP