Neuro-Inspired HTM-Based Online Capacitor Aging Detection of DC-Link Capacitors in Power Electronic Converters-Reference-Cited by-同舟云学术

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Neuro-Inspired HTM-Based Online Capacitor Aging Detection of DC-Link Capacitors in Power Electronic Converters

Published:2023-10-19 Issue: Volume: Page:1-4
ISSN:
Container-title:2023 First International Conference on Advances in Electrical, Electronics and Computational Intelligence (ICAEECI)
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Author:

Arokia Nathan Leema Prasila¹,Rani Hemamalin Ranganathan¹,Robert Jeremiah Ruben Johnson²,Partheeban Pachaivannan³

Affiliation:

1. St. Peter’s Institute of Higher Education and Research,Department of Electrical and Electronics Engineering,Chennai,India

2. Carl Von Ossietzky Universität,Department of Medical Physics and Acoustics,Oldenburg,Germany

3. Chennai Institute of Technology,Department of Civil Engineering,Chennai,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10370005/10370765/10370802.pdf?arnumber=10370802

Reference17 articles.

1. Examples for failures in power electronics systems;Wolfgang;ECPE Tutorial ‘Rel. Power Electron. Systems,2007

2. Condition Monitoring for Device Reliability in Power Electronic Converters: A Review

3. Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review

4. Physics of Failure (PoF) Based Lifetime Prediction of Power Electronics at the Printed Circuit Board Level

5. An Overview of Condition Monitoring Techniques for Capacitors in DC-Link Applications

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