Testing dielectric slab mode excitation, non-rectangular conductor profiles and edge roughness as sources of additional loss in mmWave transmission lines

Author:

Bergmann F.1,Jungwirth N.1,Bosworth B.1,Killgore J.1,Marksz E.1,Karpisz T.1,Papac M.1,Osella A.1,Enright L.1,Long C. J.1,Orloff N. D.1

Affiliation:

1. NIST,Communications Technology Laboratory,USA

Publisher

IEEE

Reference17 articles.

1. A multiline method of network analyzer calibration

2. A Transmission Line Approach for Rough Conductor Surface Impedance Analysis;tegowski;IEEE Trans Microwave Theory Techn,2022

3. Microwave and terahertz dielectric properties of single-crystalline scandate substrates for ferroic thin film deposition;bovtun;2013 23rd International Crimean Conference "Microwave & Telecommunication Technology" CriMiCo,2013

4. A general waveguide circuit theory

5. A Physical Surface Roughness Model and Its Applications

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1. Electromagnetic Modeling of a Probe for Scanning Microwave Microscopy;2023 International Symposium on Fundamentals of Electrical Engineering (ISFEE);2023-11-16

2. Measuring the anisotropic permittivity tensor of DyScO3 to 110 GHz;Applied Physics Letters;2023-08-14

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