A High-Precision Defect Quantification Method Using a Unilateral Oblique Focusing Guided Wave EMAT and a Theory-Informed Explainable Progressive Residual Deep Convolutional Network-Reference-Cited by-同舟云学术

A High-Precision Defect Quantification Method Using a Unilateral Oblique Focusing Guided Wave EMAT and a Theory-Informed Explainable Progressive Residual Deep Convolutional Network

Published:2024 Issue: Volume:73 Page:1-9
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Sun Hongyu¹^ORCID,Tu Jun²^ORCID,Feng Qibo¹^ORCID,Huang Songling³^ORCID,Peng Lisha³^ORCID,He Qixin¹^ORCID,Li Jiakun¹^ORCID,Li Shisong³^ORCID

Affiliation:

1. School of Physical Science and Engineering, Beijing Jiaotong University, Beijing, China

2. Hubei Key Laboratory of Modern Manufacturing Quality Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan, Hubei, China

3. Department of Electrical Engineering, State Key Laboratory of Power System, Tsinghua University, Beijing, China

Funder

Open Project of State Key Laboratory of Performance Monitoring and Protecting of Rail Transit Infrastructure, East China Jiaotong University

National Natural Science Foundation of China

Tangshan Science and Technology Planning Project

Project through China Postdoctoral Science Foundation

Natural Science Talent Fund Project, Beijing Jiaotong University

Hubei Key Laboratory of Modern Manufacturing Quality Engineering Open Fund

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/19/10367905/10589714.pdf?arnumber=10589714

Reference33 articles.

1. Stress Online Monitoring Method Based on Multifrequency SH0 Guided Wave Information Fusion

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3. Defect Detection for the Insulation Layer of Bent Aircraft Cables Based on Ultrasonic Guided Waves

4. Damage Imaging in Composite Laminates Using Broadband Multipath Lamb Waves

5. Line-focusing electromagnetic acoustic transducers for the detection of slit defects