“3–2–1” PMP: Adding an Extra Pattern to Dual-Band Phase Shift Profilometry for Higher Precision 3-D Imaging-Reference-Cited by-同舟云学术

“3–2–1” PMP: Adding an Extra Pattern to Dual-Band Phase Shift Profilometry for Higher Precision 3-D Imaging

Published:2024 Issue: Volume:73 Page:1-14
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Wang Jian¹^ORCID,Zhang Guanyu¹^ORCID,Guo Wei¹^ORCID,Zhang Jun²^ORCID,Zhang Zonghua³^ORCID,Chen Liangzhou¹^ORCID,Li Tukun⁴^ORCID,Jiang Xiangqian⁴^ORCID

Affiliation:

1. State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China

2. School of Information Engineering, Guangdong University of Technology, Guangzhou, China

3. School of Mechanical Engineering, Hebei University of Technology, Tianjin, China

4. EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, U.K.

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Knowledge Innovation Program of Wuhan-Basic Research

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/19/10367905/10599300.pdf?arnumber=10599300

Reference70 articles.

1. Structured Light 3D Imaging Instrument for Biological Tissues With Potential Application in Telemedicine

2. In-situ areal inspection of powder bed for electron beam fusion system based on fringe projection profilometry

3. Fringe Projection Profilometry in Production Metrology: A Multi-Scale Comparison in Sheet-Bulk Metal Forming

4. Fringe projection profilometry by conducting deep learning from its digital twin

5. Online Stress Measurement During Laser-aided Metallic Additive Manufacturing