End-to-End Direct Phase Retrieval From a Single-Frame Interferogram Based on Deep Learning-Reference-Cited by-同舟云学术

End-to-End Direct Phase Retrieval From a Single-Frame Interferogram Based on Deep Learning

Published:2024 Issue: Volume:73 Page:1-16
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Zhang Tianshan¹^ORCID,Lu Mingfeng¹^ORCID,Hu Yao²^ORCID,Hao Qun²^ORCID,Wu Jinmin³^ORCID,Zhang Nan¹^ORCID,Yang Shuai⁴^ORCID,He Wenjie¹^ORCID,Zhang Feng¹^ORCID,Tao Ran¹^ORCID

Affiliation:

1. Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China

2. Beijing Key Laboratory of Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China

3. School of Automation, Beijing Information Science and Technology University, Beijing, China

4. MIIT Key Laboratory of Complex-Field Intelligent Exploration, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China

Funder

National Natural Science Foundation of China

Strategic Priority Program of the Chinese Academy of Sciences

Laboratory Research Project of Beijing Institute of Technology

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/19/10367905/10584458.pdf?arnumber=10584458

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4. Triple N-Step Phase Shift Algorithm for Phase Error Compensation in Fringe Projection Profilometry

5. Phase-Shifting Temporal Phase Unwrapping Algorithm for High-Speed Fringe Projection Profilometry