Methodology for Diagnosis of Defect or Damage in Reflection-Symmetric Multilayer Structures Using Analysis of Late-Time Natural-Mode Amplitudes-Reference-Cited by-同舟云学术

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Methodology for Diagnosis of Defect or Damage in Reflection-Symmetric Multilayer Structures Using Analysis of Late-Time Natural-Mode Amplitudes

Published:2024 Issue: Volume:73 Page:1-8
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Hasar Ugur C.¹^ORCID,Ozturk Hamdullah²^ORCID,Nayyeri Vahid³^ORCID,Ramahi Omar M.⁴^ORCID

Affiliation:

1. Department of Electrical and Electronics Engineering, Gaziantep University, Gaziantep, Türkiye

2. Department of Electrical and Electronics Engineering, Gaziantep Islam Science and Technology University, Gaziantep, Türkiye

3. School of Advanced Technologies, Iran University of Science and Technology, Tehran, Iran

4. Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Canada

Funder

Scientific Research Unit of Gaziantep University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/19/10367905/10443945.pdf?arnumber=10443945

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