Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC
Author:
Affiliation:
1. School of Automation, Guangdong University of Technology, Guangzhou, China
2. Guangdong Fenghua Advanced Technology Holding Company Ltd., Zhaoqing, China
3. Department of Precision Engineering, The University of Tokyo, Hongo, Tokyo, Japan
Funder
Technological Innovation Project of Provincial State-Owned Company
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx8/19/10367905/10579911.pdf?arnumber=10579911
Reference27 articles.
1. Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives
2. Multiscale structural engineering of dielectric ceramics for energy storage applications: from bulk to thin films
3. Defect Detection of Skewed Images for Multilayer Ceramic Capacitors
4. Automatic Visual Detection System of Railway Surface Defects With Curvature Filter and Improved Gaussian Mixture Model
5. Defect Detection in Electronic Surfaces Using Template-Based Fourier Image Reconstruction
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