Noise Analysis Directly on Shearography Wrapped Phase Maps-Reference-Cited by-同舟云学术

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Noise Analysis Directly on Shearography Wrapped Phase Maps

Published:2024 Issue: Volume:73 Page:1-9
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Staub Diego¹^ORCID,Fantin Analucia V.²^ORCID,Willemann Daniel P.³^ORCID,Benedet Mauro E.⁴^ORCID,Cabral Thiago Destri³^ORCID,d'Almeida Ana Lúcia F. S.⁵^ORCID,Armando Albertazzi G.⁶^ORCID

Affiliation:

1. Serviço Nacional de Aprendizagem Industrial–SENAI, Florianópolis, Brazil

2. Department of Economic Sciences, University of State of Santa Catarina (UDESC), Florianópolis, Brazil

3. Department of Fishing Engineering and Biological Sciences, University of State of Santa Catarina (UDESC), Laguna, Brazil

4. BAWSF Inspections and Engineering Ltd., Florianópolis, Brazil

5. CENPES–Petrobras, Rio de Janeiro, Brazil

6. Department of Mechanical Engineering, Federal University of Santa Catarina (UFSC), Florianópolis, Brazil

Funder

Petro-bras and National Council for Scientific and Technological Development [Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)]

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/19/10367905/10495734.pdf?arnumber=10495734

Reference28 articles.

1. Robust method to improve the quality of shearographic phase maps obtained in harsh environments

2. Calibration and correction procedure for quantitative out-of-plane shearography

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