LightFlow: Lightweight Unsupervised Defect Detection Based on 2-D Flow-Reference-Cited by-同舟云学术

LightFlow: Lightweight Unsupervised Defect Detection Based on 2-D Flow

Published:2024 Issue: Volume:73 Page:1-12
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Peng Changqing¹^ORCID,Zhao Lun²^ORCID,Wang Sen¹^ORCID,Abbas Zeshan²^ORCID,Liang Feng¹^ORCID,Islam Md Shafqul³^ORCID

Affiliation:

1. Faculty of Mechanical and Electrical Engineering, Kunming University of Science and Technology, and the Advanced Equipment Intelligent Maintenance Engineering Research Center of Yunnan Province, Kunming, China

2. Institute of Ultrasonic Technology, Institute of Intelligent Manufacturing Technology, Shenzhen Polytechnic University, Shenzhen, China

3. Department of Mechanical Engineering, Blekinge Institute of Technology, Karlskrona, Sweden

Funder

National Natural Science Foundation of China

Scientific Research Start-up Fund for Shenzhen High-Caliber Personnel of Shenzhen Polytechnic University

Ultrasonic Welding Technology Research and Development Center of SZPUNewPower

Post-doctoral Later-stage Foundation Project of Shenzhen Polytechnic University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/19/10367905/10559864.pdf?arnumber=10559864

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