1. Improving the Detection of Undefined State Faults in FinFET SRAMs;2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS);2021-06-28
2. Hard-to-Detect Fault Analysis in FinFET SRAMs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-06
3. Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs;2021 IEEE European Test Symposium (ETS);2021-05-24
4. No Trouble Found (NTF) Customer Return Analysis;2020 IEEE International Reliability Physics Symposium (IRPS);2020-04
5. A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs;2020 Design, Automation & Test in Europe Conference & Exhibition (DATE);2020-03