Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
23 articles.
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1. Logic Built-In Self-Test;VLSI Test Principles and Architectures;2006
2. Minimal length test vectors for multiple-fault detection;Theoretical Computer Science;2004-05
3. On the testing quality of random and pseudo-random sequences for permanent and intermittent faults;Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198);1999
4. Pseudorandom test-length analysis using differential solutions;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1996-07
5. Pseudorandom testing of microprocessors at instruction/data flow level;Dependable Computing — EDCC-2;1996