Author:
Sato Yasuo,Yamaguchi Hisato,Matsuzono Makoto,Kajihara Seiji
Cited by
20 articles.
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1. Reduced On-chip Storage of Seeds for Built-in Test Generation;ACM Transactions on Design Automation of Electronic Systems;2024-03-14
2. Storage-Based Logic Built-In Self-Test With Cyclic Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
3. Storage-Based Logic Built-In Self-Test With Partitioned Deterministic Compressed Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-09
4. Improving of Fault Diagnosis Ability by Test Point Insertion and Output Compaction;2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2023-06-25
5. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02