Author:
Chandra Anshuman,Saikia Jyotirmoy,Kapur Rohit
Cited by
17 articles.
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1. Compact Set of LFSR Seeds for Diagnostic Tests;2021 IEEE 39th VLSI Test Symposium (VTS);2021-04-25
2. Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-12
3. Functional Broadside Tests Under Broadcast Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
4. Extra Clocking of LFSR Seeds for Improved Path Delay Fault Coverage;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-02
5. LFSR-Based Test Generation for Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-02