Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
26 articles.
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1. Bevel Edge Termination for Vertical GaN Power Diodes;2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA);2019-10
2. Breakdown Voltage;Fundamentals of Power Semiconductor Devices;2018-09-29
3. Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic;Microelectronics Reliability;2011-03
4. Breakdown Voltage;Fundamentals of Power Semiconductor Devices;2008
5. Numerical investigation of quantum wires in bevel-etched heterostructures;Semiconductor Science and Technology;2007-08-06