Frequency and temperature tests for lateral nonuniformities in MIS capacitors-Reference-Cited by-同舟云学术

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Frequency and temperature tests for lateral nonuniformities in MIS capacitors

Published:1977-10 Issue:10 Volume:24 Page:1249-1255
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Chang C.C.,Johnson W.C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/31768/01479180.pdf?arnumber=1479180

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