Heavy ion linear energy transfer measurements during single event upset testing of electronic devices-Reference-Cited by-同舟云学术

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Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

Published:1999-02 Issue:1 Volume:46 Page:59-69
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Zajic V.¹,Thieberger P.

Affiliation:

1. Brookhaven Nat. Lab., Upton, NY, USA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx4/23/16136/00747768.pdf?arnumber=747768

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