Microwave Noise and FET Devices
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation
Link
http://xplorestaging.ieee.org/ielx5/6668/5564354/05564373.pdf?arnumber=5564373
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Four-Port Noise De-Embedding Methodology for On-Wafer Microwave Device Based on Electromagnetic Simulation;IEEE Microwave and Wireless Technology Letters;2024-07
2. On‐Wafer Noise Measurements;Precision Measurement of Microwave Thermal Noise;2022-11-22
3. Equivalent‐circuit extraction for gallium nitride electron devices: Direct versus optimization‐empowered approaches;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2022-04-03
4. Field Effect Transistors;A Guide to Noise in Microwave Circuits;2021-11-26
5. Gray Wolf Optimization-Based Modeling Technique Applied to GaN High Mobility Electron Transistors;IEEE Journal of the Electron Devices Society;2021
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