Author:
Yang F.,Chakravarty S.,Devta-Prasanna N.,Reddy S.M.,Pomeranz I.
Cited by
7 articles.
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1. Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
2. Test Generation for Defect-Based Faults of Scan Flip-Flops;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
3. Test of Reconfigurable Modules in Scan Networks;IEEE Transactions on Computers;2018-12-01
4. Structure-Oriented Test of Reconfigurable Scan Networks;2017 IEEE 26th Asian Test Symposium (ATS);2017-11
5. Test Strategies for Reconfigurable Scan Networks;2016 IEEE 25th Asian Test Symposium (ATS);2016-11