Testing for Missing-Gate Faults in Reversible Circuits-Reference-Cited by-同舟云学术

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Testing for Missing-Gate Faults in Reversible Circuits

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Container-title:13th Asian Test Symposium
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Author:

Hayes J.P.,Polian I.,Becker B.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/9468/30045/01376543.pdf?arnumber=1376543

Cited by 61 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Modelling reliability of reversible circuits with 2D second-order cellular automata;Physica D: Nonlinear Phenomena;2024-08

2. Design‐for‐testability for reversible logic circuits based on bit‐swapping;IET Quantum Communication;2023-11-30

3. A Fault Detection Method for Missing Gate Faults in Reversible Circuits Using Binary to Gray Code Conversion;TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON);2023-10-31

4. A review on camera calibration in soccer videos;Multimedia Tools and Applications;2023-07-17

5. Analysis of Single Missing Gate Faults in Quantum Circuit;Lecture Notes in Networks and Systems;2022-11-10

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