Stress Testing With Influencing Factors to Accelerate Data Race Software Failures

Author:

Qiu KunORCID,Zheng ZhengORCID,Trivedi Kishor S.,Yin Beibei

Funder

National Natural Science Foundation of China

Equipment Preliminary R&D Project of China

Ministry of Industry and Information Technology of the People's Republic of China

National Science Foundation

IBM Center for the Business of Government

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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