Defect Structure and Spectroscopic Properties of CdTe-based X- and Gamma-Ray Detectors-Reference-Cited by-同舟云学术

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Defect Structure and Spectroscopic Properties of CdTe-based X- and Gamma-Ray Detectors

Published:2021-10-16 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
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Author:

Maslyanchuk O.¹,Solovan M.¹,Boledzyuk I.¹,Fodchuk I.¹,Gnatyuk V.²,Aoki T.³

Affiliation:

1. Yuriy Fedkovych Chernivtsi National University,Chernivtsi,Ukraine,58012

2. Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine,Kyiv,Ukraine,03028

3. Shizuoka University,Research Institute of Electronics,Hamamatsu,Japan,432-8011

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9875398/9875424/09875806.pdf?arnumber=9875806

Reference25 articles.

1. Efficiency spectrum of a CdTe X‐ and γ‐ray detector with a Schottky diode

2. Special Features of Charge Transport in Schottky Diodes Based on Semi-insulating CdTe

3. The COCAE Detector: An Instrument for Localization—Identification of Radioactive Sources

4. Reasons of low charge collection efficiency in CdTe-based X/?-ray detectors with ohmic contacts;aoki,0

5. High energy resolution CdTe Schottky diode γ-ray detectors

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