A low frequency electric field probe for near-field measurement in EMC applications-Reference-Cited by-同舟云学术

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A low frequency electric field probe for near-field measurement in EMC applications

Published:2017-08 Issue: Volume: Page:
ISSN:
Container-title:2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
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Author:

Li Guanghua,Pommerenke David,Min Jin

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8053881/8077822/08077921.pdf?arnumber=8077921

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Miniaturized Ultrawideband V-Shaped Tip E-Probe for Near-Field Measurements;Sensors;2024-07-02

2. A Wideband E_x-E_y-E_z Hybrid Electric Probe for Near-field Measurement;2024 Photonics & Electromagnetics Research Symposium (PIERS);2024-04-21

3. A Miniature Electric Probe With a High Spatial Resolution;IEEE Transactions on Instrumentation and Measurement;2024

4. Wideband Diagnostics for Online Measurement of Temporal Information of Beams in a Storage Ring;IEEE Transactions on Instrumentation and Measurement;2024

5. Design of Miniature Ultrawideband Active Magnetic Field Probe Using Integrated Design Idea;Sensors;2023-07-05

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