Author:
Chen Yuan,Chen Bichen,He Jiayi,Zai Richard,Fan Jun,Drewniak James
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Novel Method for LPDDR5 DRAM Jitter Measurement Through De-embedding;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28
2. 1X De-embedding Method Based on Artificial Neural Network;2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT);2023-05-14
3. Fast End-to-end Channel Electrical Characterization Methodology for Design and Manufacture Quality Check;2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT);2022-10-26
4. Characterization of a Wafer-Level Packaged Au−Ru/AlCu Contact for Micro-Switches;Journal of Microelectromechanical Systems;2022-08
5. Generalized analytical formulation for de‐embedding of multiport devices based on known fixtures;International Journal of RF and Microwave Computer-Aided Engineering;2022-07-29