Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production-Reference-Cited by-同舟云学术

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Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production

Published:2021-11-28 Issue: Volume: Page:
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Container-title:2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)
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Author:

Ogihara Gaku,Nakatani Takayuki,Iimori Daisuke,Katayama Shogo,Kuwana Anna,Sato Keno,Ishida Takashi,Okamoto Toshiyuki,Ichikawa Tamotsu,Zhao Yujie,Wei Jianglin,Hatayama Kazumi,Kobayashi Haruo

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9665417/9665446/09665508.pdf?arnumber=9665508

Reference6 articles.

1. Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in $\mu\mathrm{V}$ - order by DC-AC Conversion;sasaki;IEEE 3rd International Test Conference in Asia,2019

2. Accurate Testing of Precision Voltage Reference by DC-AC Conversion

3. Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

4. Research on nano-ampere current-measuring meter system

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2023

2. Innovative Practices Track: Innovative Analog Circuit Testing Technologies;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25

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