Statistical Compact Modeling With Artificial Neural Networks-Reference-Cited by-同舟云学术

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Statistical Compact Modeling With Artificial Neural Networks

Published:2023-12 Issue:12 Volume:42 Page:5156-5160
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Dai Wu¹^ORCID,Li Yu¹^ORCID,Rong Zhao²^ORCID,Peng Baokang¹^ORCID,Zhang Lining¹^ORCID,Wang Runsheng³^ORCID,Huang Ru³

Affiliation:

1. School of Electronic and Computer Engineering, Peking University, Shenzhen, China

2. Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Sai Kung, Hong Kong

3. Institute of EDA, Peking University, Wuxi, China

Funder

Natural Science Foundation of China

Shenzhen Science and Technology Project

Higher Education Discipline Innovation Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/10325328/10147901.pdf?arnumber=10147901

Reference13 articles.

1. Compact modeling of quantum confinements in nanoscale gate-all-around MOSFETs

2. Deep-Learning-Assisted Physics-Driven MOSFET Current-Voltage Modeling

3. Artificial Neural Network-Based Compact Modeling Methodology for Advanced Transistors

4. Statistical Modeling With the PSP MOSFET Model

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Overview of emerging semiconductor device model methodologies: From device physics to machine learning engines;Fundamental Research;2024-02

2. Generic Compact Modeling of Emerging Memories With Recurrent NARX Network;IEEE Electron Device Letters;2023-08

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