Towards Critical Flip-Flop Identification for Soft-Error Tolerance with Graph Neural Networks-Reference-Cited by-同舟云学术

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Towards Critical Flip-Flop Identification for Soft-Error Tolerance with Graph Neural Networks

Published:2023 Issue: Volume: Page:1-1
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Lu Li¹^ORCID,Chen Junchao¹^ORCID,Ulbricht Markus¹^ORCID,Krstic Milos¹^ORCID

Affiliation:

1. IHP-Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany

Funder

Bundesministerium f?r Bildung und Forschung

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6917053/10314712.pdf?arnumber=10314712

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Preterm infant limb movement recognition with graph and convolution fusion network;Pattern Recognition;2025-02

2. Machine Learning Methodologies to Predict the Results of Simulation-Based Fault Injection;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-05

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