Correlated Rare Failure Analysis via Asymptotic Probability Evaluation-Reference-Cited by-同舟云学术

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Correlated Rare Failure Analysis via Asymptotic Probability Evaluation

Published:2021 Issue: Volume: Page:1-1
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Tao Jun¹,Yu Handi²,Su Yangfeng³,Zhou Dian⁴,Zeng Xuan²,Li Xin⁵

Affiliation:

1. ASIC & System State Key Lab, School of Microelectronics, Fudan University, Shanghai 200433, China. (e-mail: taojun@fudan.edu.cn)

2. ASIC & System State Key Lab, School of Microelectronics, Fudan University, Shanghai 200433, China.

3. School of Mathematical Sciences, Fudan University, Shanghai 200433, China.

4. Department of Electrical Engineering, University of Texas at Dallas, Richardson, TX 75080, USA.

5. Data Science Research Center, Duke Kunshan University, Kunshan, Jiangsu 215316, China.

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6917053/09403401.pdf?arnumber=9403401

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