Fast Statistical Analysis of Rare Failure Events with Truncated Normal Distribution in High-Dimensional Variation Space-Reference-Cited by-同舟云学术

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Fast Statistical Analysis of Rare Failure Events with Truncated Normal Distribution in High-Dimensional Variation Space

Published:2021 Issue: Volume: Page:1-1
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Gao Zhengqi,Tao Jun,Su Yangfeng,Zhou Dian,Zeng Xuan,Li Xin

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6917053/09383808.pdf?arnumber=9383808

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Efficient Memory Circuits Yield Analysis and Optimization Framework via Meta-Learning;IEEE Transactions on Circuits and Systems II: Express Briefs;2024-09

3. Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022

4. Blocking Probability in Obstructed Tunnels with Reconfigurable Intelligent Surface;IEEE Communications Letters;2021

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