Compact Functional Testing for Neuromorphic Computing Circuits-Reference-Cited by-同舟云学术

Compact Functional Testing for Neuromorphic Computing Circuits

Published:2022 Issue: Volume: Page:1-1
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

El-Sayed Sarah A.¹,Spyrou Theofilos²,Camunas-Mesa Luis A.³^ORCID,Stratigopoulos Haralampos-G.²^ORCID

Affiliation:

1. Sorbonne Université, Centre National de la Recherche Scientifique (CNRS), LIP6, France

2. Sorbonne Université, CNRS, LIP6, France

3. Instituto de Microelectrónica de Sevilla (IMSE-CNM), Consejo Superior de Investigaciones Científicas (CSIC), Universidad de Sevilla, Sevilla, Spain

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6917053/09956887.pdf?arnumber=9956887

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