CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural Networks-Reference-Cited by-同舟云学术

CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural Networks

Published:2023-10 Issue:10 Volume:42 Page:3289-3300
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Nguyen Thai-Hoang¹^ORCID,Imran Muhammad²^ORCID,Choi Jaehyuk³^ORCID,Yang Joon-Sung⁴^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea

2. Department of Electrical Engineering, School of Electrical Engineering and Computer Science, National University of Sciences and Technology, Islamabad, Pakistan

3. Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon, South Korea

4. School of Electrical and Electronic Engineering and Department of System Semiconductor Engineering, Yonsei University, Seoul, South Korea

Funder

Institute of Information & Communications Technology Planning & Evaluation

Korea Government

Next Generation Intelligent Semiconductor Development by the Ministry of Trade, Industry and Energy

Basic Science Research Program through the National Research Foundation of Korea funded by the Ministry of Education

Samsung Electronics

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/10255327/10038658.pdf?arnumber=10038658

Reference39 articles.

1. SAFER: Stuck-At-Fault Error Recovery for Memories

2. A Fault-Tolerant Neural Network Architecture

3. Use ECP, not ECC, for hard failures in resistive memories

4. Pay-As-You-Go

5. RDIS: Tolerating Many Stuck-At Faults in Resistive Memory

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