Reliability-configurable mixed-grained reconfigurable array supporting C-to-array mapping and its radiation testing-Reference-Cited by-同舟云学术

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Reliability-configurable mixed-grained reconfigurable array supporting C-to-array mapping and its radiation testing

Published:2013-11 Issue: Volume: Page:
ISSN:
Container-title:2013 IEEE Asian Solid-State Circuits Conference (A-SSCC)
language:
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Author:

Alnajjar Dawood,Konoura Hiroaki,Mitsuyama Yukio,Shimada Hajime,Kobayashi Kazutoshi,Kanbara Hiroyuki,Ochi Hiroyuki,Imagawa Takashi,Noda Shinichi,Wakabayashi Kazutoshi,Hashimoto Masanori,Onoye Takao,Onodera Hidetoshi

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6679622/6690965/06691045.pdf?arnumber=6691045

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