Saying ‘Hi!’ is not enough: Mining inputs for effective test generation

Author:

Toffola Luca Della,Staicu Cristian-Alexandru,Pradel Michael

Publisher

IEEE

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. June: A Type Testability Transformation for Improved ATG Performance;Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis;2023-07-12

2. CodaMosa: Escaping Coverage Plateaus in Test Generation with Pre-trained Large Language Models;2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE);2023-05

3. Automated, Cost-effective, and Update-driven App Testing;ACM Transactions on Software Engineering and Methodology;2022-07-12

4. BeDivFuzz;Proceedings of the 44th International Conference on Software Engineering;2022-05-21

5. The Art, Science, and Engineering of Fuzzing: A Survey;IEEE Transactions on Software Engineering;2021-11-01

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