Empirical Study on the Applicability of Two-Port Deembedding Techniques for Characterization of Four-Port Asymmetric Devices
Author:
Affiliation:
1. Technische Universität Braunschweig,Hans-Sommer-Straße 66,Braunschweig,Germany,D-38106
2. Infineon Technologies AG,Am Campeon 1-15,Neubiberg,Germany,D-85579
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9720035/9720036/09720038.pdf?arnumber=9720038
Reference9 articles.
1. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
2. Novel realistic short structure construction for parasitic resistance de-embedding and on-wafer inductor characterization
3. Extension of Thru de-embedding technique for asymmetrical and differential devices
4. Microwave Engineering;pozar,2012
5. Multimode TRL Calibration Technique for Characterization of Differential Devices
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Comparative Study on De-embedding of Highly Assymetrical Differential Devices using Multimode TRL and Applicability of Mode Separation;2024 103rd ARFTG Microwave Measurement Conference (ARFTG);2024-06-21
2. Empirical Study on the Validity of the Modal Separation Approach for Deembedding of Highly Asymmetrical Passive Differential Devices;2023 100th ARFTG Microwave Measurement Conference (ARFTG);2023-01-22
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