A neural network approach to the inspection of ball grid array solder joints on printed circuit boards
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6927/18674/00861463.pdf?arnumber=861463
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Automated void detection in high resolution x-ray printed circuit boards (PCBs) images with deep segmentation neural network;Engineering Applications of Artificial Intelligence;2024-07
2. A novel solder joints inspection method using curvature and geometry features in high-density flexible IC substrates surface mount technology;Physica Scripta;2021-11-25
3. Optimization Methods on the Wavelet Transformation Base for Technical Diagnostic Information Systems;2021 11th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS);2021-09-22
4. An online machine learning framework for early detection of product failures in an Industry 4.0 context;International Journal of Computer Integrated Manufacturing;2019-02-02
5. A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology;IEEE Transactions on Industrial Electronics;2017-04
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