Building Post-layout Performance Model of Analog/RF Circuits by Fine-tuning Technique-Reference-Cited by-同舟云学术

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Building Post-layout Performance Model of Analog/RF Circuits by Fine-tuning Technique

Published:2022-04-06 Issue: Volume: Page:
ISSN:
Container-title:2022 23rd International Symposium on Quality Electronic Design (ISQED)
language:
Short-container-title:

Author:

Wang Zhikai¹,Hu Wenfei¹,Zhou Jingbo²,Zhang Wenyuan³,Wang Ruitao¹,Zhang Jian¹,Dou Dejing²,Ye Zuochang¹,Wang Yan¹

Affiliation:

1. Tsinghua University,Institute of Microelectronics, School of Integrated Circuits,Beijing,China,100084

2. Baidu Research

3. Beijing Institute of Technology

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9806045/9806137/09806251.pdf?arnumber=9806251

Reference21 articles.

1. Towards Decrypting the Art of Analog Layout: Placement Quality Prediction via Transfer Learning

2. Finding Deterministic Solution From Underdetermined Equation: Large-Scale Performance Variability Modeling of Analog/RF Circuits

3. Bayesian model fusion

4. Transfer learning with bayesian optimization-aided sampling for efficient AMS circuit modeling

5. Neural networks for the modeling of aggregate crushing operations;larison,1999

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