Simulation and Experimental Investigation of Temperature-Current Rise in PCB with different electrical current and trace width
Author:
Affiliation:
1. Naval University of Engineering,School of Electronic Engineering,Wuhan,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10053086/10053095/10053194.pdf?arnumber=10053194
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4. Experimental investigation of temperature-current rise in fine PCB copper traces on polyimide, aluminium and ceramic (A1203) substrates [J];petrosyants;Advanced Materials Research,2013
5. New correlations between electrical current and temperature rise in PCB traces
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