Author:
Jingyang Zhang ,Dawn Wang ,Hanyi Ding ,Gillis John,Wan Ni ,Sweeney Susan,Dasheng Fang
Cited by
1 articles.
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1. Impact of Layout Parasitics and Thermal Coupling on PA performance and ruggedness in SiGe HBTs;2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2022-10-16