Power and EM SCA Resilience in 65nm AES-256 Exploiting Clock-Slew Dependent Variability in CMOS Digital Circuits-Reference-Cited by-同舟云学术

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Power and EM SCA Resilience in 65nm AES-256 Exploiting Clock-Slew Dependent Variability in CMOS Digital Circuits

Published:2023-04 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Custom Integrated Circuits Conference (CICC)
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Author:

Ghosh Archisman¹,Rahman Md. Abdur¹,Das Debayan¹,Ghosh Santosh²,Sen Shreyas¹

Affiliation:

1. Purdue University, IN,USA

2. Intel Corp.,Portland,OR,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10121189/10121178/10121240.pdf?arnumber=10121240

Reference10 articles.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Power and EM Side-Channel-Attack-Resilient AES-128 Core with Round-Aligned Globally-Synchronous-Locally-Asynchronous Operation Based on Tunable Replica Circuits;2024 IEEE International Solid-State Circuits Conference (ISSCC);2024-02-18

2. 16.6 PACTOR: A Variation-Tolerant Probing-Attack Detector for a 2.5Gb/s×4-Channel Chip-to-Chip Interface in 28nm CMOS;2024 IEEE International Solid-State Circuits Conference (ISSCC);2024-02-18

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