Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs-Reference-Cited by-同舟云学术

Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs

Published:2017-02 Issue:2 Volume:64 Page:521-526
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Acerbi Fabio,Davini Stefano,Ferri Alessandro,Galbiati Cristiano,Giovanetti Graham,Gola Alberto,Korga George,Mandarano Andrea,Marcante Marco,Paternoster Giovanni,Piemonte Claudio,Razeto Alessandro,Regazzoni Veronica,Sablone Davide,Savarese Claudio^ORCID,Zappala Gaetano,Zorzi Nicola^ORCID

Funder

National Science Foundation (U.S.) for Princeton University

Istituto Nazionale di Fisica Nucleare (Italy)

Laboratori Nazionali del Gran Sasso (Italy)

NUV-HD and NUV-HD-LF SiPM technologies

EU FP7 Project SUBLIMA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://ieeexplore.ieee.org/ielaam/16/7828063/7807295-aam.pdf

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