Broadband Dielectric Characterization of Glasses and Other Silicates up to the THz Frequencies
Author:
Affiliation:
1. APMS section, Aalborg University,Aalborg,Denmark
2. Materials Research Institute, Penn State University,State College,PA,USA,16802
Funder
National Science Foundation
VILLUM FONDEN
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10237348/10237371/10237692.pdf?arnumber=10237692
Reference14 articles.
1. Structural characterization of noncrystalline solids and glasses using solid state NMR
2. Glass for 5G applications
3. Dielectric polarizabilities of ions in oxides and fluorides
4. Special glass for packaging of high frequency electronics
5. Complex permittivity of common dielectrics in 20–110 GHz frequency range measured with a Fabry–Pérot open resonator
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1. Effect of the boson peak and the ionic resonance in the dielectric properties of silicate materials at mm-wave and THz frequencies;Materials Research Bulletin;2024-09
2. Novel Glass Material with Low Loss and Permittivity for 5G/6G Integrated Circuits;2024 IEEE INC-USNC-URSI Radio Science Meeting (Joint with AP-S Symposium);2024-07-14
3. Analysis of the Dielectric Properties of Alkali-Free Aluminoborosilicate Glasses by Considering the Contributions of Electronic and Ionic Polarizabilities in the GHz Frequency Range;Materials;2024-03-19
4. Dielectric Characterization of Materials at 5G mm-Wave Frequencies;2024 18th European Conference on Antennas and Propagation (EuCAP);2024-03-17
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