Electrical Reliability of Flexible Low-Temperature Polycrystalline Oxide Thin-Film Transistors Under Mechanical Stress-Reference-Cited by-同舟云学术

Electrical Reliability of Flexible Low-Temperature Polycrystalline Oxide Thin-Film Transistors Under Mechanical Stress

Published:2023-02 Issue:2 Volume:70 Page:527-531
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Han Chanhee¹^ORCID,Kim Hyojung¹^ORCID,Kim Dongbhin¹^ORCID,Shin Jaewoo¹^ORCID,Park Yubin¹^ORCID,Byun Changwoo²^ORCID,Choi Byoungdeog¹^ORCID

Affiliation:

1. Department of Electronic and Electrical Engineering, Sungkyunkwan University, Suwon-si, South Korea

2. Research Center for Materials, Components and Equipment, Advanced Institutes of Convergence Technology (AICT), Seoul National University, Suwon-si, South Korea

Funder

Competency Development Program for Industry Specialists of the Korean Ministry of Trade, Industry and Energy (MOTIE), operated

Korea Institute for Advancement of Technology

Materials, Components and Equipment Research Program through the Gyeonggi Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/10025571/09994626.pdf?arnumber=9994626

Reference29 articles.

1. Highly flexible cover window using ultra-thin glass for foldable displays

2. Determination and Generation Mechanisms of Residual Stresses in Thin Films Produced by Physical Vapor Deposition Techniques

3. Analysis of thin film stress measurement techniques

4. Tensile deformation of an ultrafine-grained aluminium alloy: Micro shear banding and grain boundary sliding

5. Effect of Tensile and Compressive Bending Stress on Electrical Performance of Flexible a-IGZO TFTs

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