Review of thermal characteristics simulation analysis of electronic components

Author:

Ma Chi1,Tu Yuan2,Ren Yan1,Zhou Shengze1,Wang Zhizhe1

Affiliation:

1. China Electronic Product Reliability and Environmental Testing Research Institute,Components and Materials Research Departmen,Guangzhou,China

2. China Electronic Product Reliability and Environmental Testing Research Institute,Electronic Component Inspection and Testing Center,Guangzhou,China

Publisher

IEEE

Reference42 articles.

1. PSpice-COMSOL-Based 3-D Electrothermal–Mechanical Modeling of IGBT Power Module

2. Research on failures of bonding wire in IGBTs module;wendong,2016

3. Field-circuit coupling modeling and multi-rate electro-thermal co-simulation analysis of merged PiN schottky SiC diode;yingjie;Proceedings of the CSEE,2019

4. IGBT electro-thermal simulation under dynamic avalanche condition considering distribution of electro-thermal stress on chip;tianzhao;Proceedings of the CSEE,2021

5. Electrothermal Modeling of the Insulated Gate Bipolar Transistor (IGBT) Using PSpice: Application to DC–DC Converter

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