An analytical thermal noise model of deep submicron MOSFET's
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx5/55/16900/00778156.pdf?arnumber=778156
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5. Analysis of the impedance field of saturated MOSFETs and drain thermal noise;Solid-State Electronics;2017-04
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