A large dynamic range radiation-tolerant analog memory in a quarter-micron CMOS technology
Author:
Affiliation:
1. Exp. Phys. Div., CERN, Geneva, Switzerland
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx5/23/20354/00940095.pdf?arnumber=940095
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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